Ido Dolev is executive vice president, product solutions for Onto Innovation, responsible for all of Onto’s product solutions, including inspection, metrology, lithography, and software. Before joining Onto Innovation, Mr. Dolev spent seven years at KLA Corporation serving first as senior director of engineering and head of the measurement technologies group in the overlay business unit and most recently as vice president and general manager of its optical metrology division for four years. Prior to KLA, Mr. Dolev served at Applied Materials for 11 years, including as group manager and head of the optical wafer inspection and mask inspection technology group and as a physicist. Mr. Dolev holds a Bachelor of Science in mathematics and physics, a Master of Science in physics, and a Ph.D. in electrical engineering from Tel Aviv University.